Factors Affecting Universal Testing Machine

Factors affecting universal testing machine

 1. The force sensor of the electronic universal testing machine, because the quality of the sensor determines the accuracy and stability of the testing machine. The sensors used in the current electronic universal testing machine on the market generally use S-type sensors for small force values, and the strong value is average. With spoke type sensors, the inside of the sensor is generally a resistance strain gauge. If the accuracy of the strain gauge is not high, the anti-aging ability of the glue used to fix the strain gauge is not good, or the material of the sensor is not good, the accuracy and service life of the sensor will be affected. The imported sensor used has high accuracy, good linearity, and very stable performance, which will not change for decades.

2. The electronic universal testing machine drives the ball screw of the sensor movement, because if the screw has a gap, the future test data will directly respond to the Z deformation and elongation after the test. At present, some screw rods of electronic universal testing machines on the market use T-shaped ordinary screw rods. In this case, the gap is relatively large, and the friction force is relatively large and the service life is short.

3. The transmission system of the electronic universal testing machine. At present, the transmission system of the electronic universal testing machine on the market adopts reducers and some adopts ordinary belts. The main drawbacks of these two transmission methods: the former requires regular lubrication, and the latter This cannot ensure that the synchronization of the transmission affects the test results. The transmission system of the electronic universal testing machine adopts full-arc synchronous belt deceleration to ensure the synchronization accuracy of the transmission. The transmission accuracy is high, the efficiency is high, the transmission is stable, the noise is low, and the service life is not maintained.